1st place @ EWSN 2017 Dependability Competition

21.02.2017

Roman Lim, Reto Da Forno, and Feliz Sutton make first place at EWSN 2017 Dependability Competition. Congratulations!

medal picture

Using their approach for

Robust Flooding using Back-to-Back Synchronous Transmissions with Channel-Hopping

Roman Lim, Reto Da Forno, and Felix Sutton make 1st place to the EWSN 2017 Dependability Competition. Congratulations!

More details about the protocol (PDF, 920 KB)

Presentation of the Competition Results (PDF, 2.9 MB)

UPDATE

The source code of the protocol is now available on GitHub

award picture
 
 
Page URL: http://www.tec.ee.ethz.ch/TEC-News/2017/02/1st-place--ewsn-2017-dependability-competition.html
Fri May 26 03:47:08 CEST 2017
© 2017 Eidgenössische Technische Hochschule Zürich